OPILSKI, Aleksander. On the possibility of an investigation of semiconductor surface properties using ultrasonic surface waves. Archives of Acoustics, [S. l.], v. 1, n. 1, p. 29–32, 2016. Disponível em: https://acoustics.ippt.pan.pl/index.php/aa/article/view/3500. Acesso em: 17 aug. 2025.